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Field Emission Scanning Electron Microscope

Model HV-EXP796
Field Emission Scanning Electron Microscope Resolution (SEI) = 1.0 nm (Acc. V. 15kV) 2.2 nm (1kV) Accelerating Voltage = 0.5 to 2.9kV (10 V steps) 3 to 30 kV (100 V steps Magnification = x 25 to 650,000 Imaging modes = SEI, BEI Max. Specimen Size = 200 mm diam. Elemental Range (EDS) Be to U .

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